Lim, D.; Lee, W.; Park, J.; Lee, S.; Ju, B.-K.
Reduced ΔCTE and Galvanic Corrosion Failures in Mass Production by Using a Robust Design for Medium to Large Display Panels. Electronics 2025, 14, 2438.
https://doi.org/10.3390/electronics14122438
AMA Style
Lim D, Lee W, Park J, Lee S, Ju B-K.
Reduced ΔCTE and Galvanic Corrosion Failures in Mass Production by Using a Robust Design for Medium to Large Display Panels. Electronics. 2025; 14(12):2438.
https://doi.org/10.3390/electronics14122438
Chicago/Turabian Style
Lim, Dogi, Wonhee Lee, Jongcheol Park, Seongyoung Lee, and Byeong-Kwon Ju.
2025. "Reduced ΔCTE and Galvanic Corrosion Failures in Mass Production by Using a Robust Design for Medium to Large Display Panels" Electronics 14, no. 12: 2438.
https://doi.org/10.3390/electronics14122438
APA Style
Lim, D., Lee, W., Park, J., Lee, S., & Ju, B.-K.
(2025). Reduced ΔCTE and Galvanic Corrosion Failures in Mass Production by Using a Robust Design for Medium to Large Display Panels. Electronics, 14(12), 2438.
https://doi.org/10.3390/electronics14122438