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Journal: ElectronicsVolume: 14Number: 2427
Article: Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure
  • Authors:
  • Yifan Wang1,
  • Tiancheng Yuan1,† and
  • Yuting Yang1,†
  • et al.
Link: https://www.mdpi.com/2079-9292/14/12/2427

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