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Journal: Electronics, 2025
Volume: 14
Number: 2427

Article: Accelerating Visual Anomaly Detection in Smart Manufacturing with RDMA-Enabled Data Infrastructure
Authors: by Yifan Wang, Tiancheng Yuan, Yuting Yang, Miao He, Richard Wu and Kenneth P. Birman
Link: https://www.mdpi.com/2079-9292/14/12/2427

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