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Journal: Electronics, 2025
Volume: 14
Number: 2402

Article: Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers
Authors: by Wen Zhang, Jian Shi, Xiaoqian Zhu, Zibo Lu, Huanrui Liu and Xinyang Zhu
Link: https://www.mdpi.com/2079-9292/14/12/2402

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