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Journal: Electronics, 2025
Volume: 14
Number: 2402
Article:
Design and Testing of Nanovolt-Level Low-Noise Ag-AgCl Electrodes for Expendable Current Profilers
Authors:
by
Wen Zhang, Jian Shi, Xiaoqian Zhu, Zibo Lu, Huanrui Liu and Xinyang Zhu
Link:
https://www.mdpi.com/2079-9292/14/12/2402
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