Order Article Reprints

Zhu Y, Zhao D, Dai F, Chen Y, Liu F, Wu B, Zhao Y, Ren B, Wang Y, Liang Y, et al. Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights. Electronics. 2025; 14(10):1937. https://doi.org/10.3390/electronics14101937

Zhu, Yaxing, Dongyan Zhao, Fei Dai, Yanning Chen, Fang Liu, Bo Wu, Yang Zhao, Bocong Ren, Yanhong Wang, Yingzong Liang, and et al. 2025. "Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights" Electronics 14, no. 10: 1937. https://doi.org/10.3390/electronics14101937

Zhu, Y., Zhao, D., Dai, F., Chen, Y., Liu, F., Wu, B., Zhao, Y., Ren, B., Wang, Y., Liang, Y., & Wang, J. (2025). Impact of Electromagnetic Pulses on N-Type MOSFET Reliability: Experimental Insights. Electronics, 14(10), 1937. https://doi.org/10.3390/electronics14101937