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Journal: ElectronicsVolume: 14Number: 212
Article: Application of Reduced Order Surrogate Models in Compatible Determination of Material Properties Profiles by Eddy Current Method
  • Authors:
  • Volodymyr Y. Halchenko1,
  • Ruslana Trembovetska1 and
  • Volodymyr Tychkov1
  • et al.
Link: https://www.mdpi.com/2079-9292/14/1/212

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