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Journal: Electronics, 2024
Volume: 13
Number: 842

Article: Robust Testing of AI Language Model Resiliency with Novel Adversarial Prompts
Authors: by Brendan Hannon, Yulia Kumar, Dejaun Gayle, J. Jenny Li and Patricia Morreale
Link: https://www.mdpi.com/2079-9292/13/5/842

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