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Journal: Electronics, 2024
Volume: 13
Number: 4234
Article:
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
Authors:
by
Paolo Bernardi, Gabriele Filipponi, Giusy Iaria, Claudia Bertani and Vincenzo Tancorre
Link:
https://www.mdpi.com/2079-9292/13/21/4234
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