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Electronics2024, 13(2), 456;https://doi.org/10.3390/electronics13020456

Journal: ElectronicsVolume: 13Number: 456

Article: Landmark-Based Domain Adaptation and Selective Pseudo-Labeling for Heterogeneous Defect Prediction

Authors:
Yidan Chen¹ and
Haowen Chen^2,*

Link: https://www.mdpi.com/2079-9292/13/2/456

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