Song, Y.; Xia, W.; Li, Y.; Li, H.; Yuan, M.; Zhang, Q.
AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection. Electronics 2024, 13, 284.
https://doi.org/10.3390/electronics13020284
AMA Style
Song Y, Xia W, Li Y, Li H, Yuan M, Zhang Q.
AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection. Electronics. 2024; 13(2):284.
https://doi.org/10.3390/electronics13020284
Chicago/Turabian Style
Song, Yongxian, Wenhao Xia, Yuanyuan Li, Hao Li, Minfeng Yuan, and Qi Zhang.
2024. "AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection" Electronics 13, no. 2: 284.
https://doi.org/10.3390/electronics13020284
APA Style
Song, Y., Xia, W., Li, Y., Li, H., Yuan, M., & Zhang, Q.
(2024). AnomalySeg: Deep Learning-Based Fast Anomaly Segmentation Approach for Surface Defect Detection. Electronics, 13(2), 284.
https://doi.org/10.3390/electronics13020284