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Journal: ElectronicsVolume: 13Number: 2012
Article: Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP
- Authors:
- Shunshun Zheng1,2,
- Zhangang Zhang2,* and
- Jiefeng Ye1,2
- et al.
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