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Electronics
Volume 13
Issue 11
10.3390/electronics13112012
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Journal: Electronics, 2024
Volume: 13
Number: 2012

Article: Experimental Study of the Impact of Temperature on Atmospheric Neutron-Induced Single Event Upsets in 28 nm Embedded SRAM of SiP
Authors: by Shunshun Zheng, Zhangang Zhang, Jiefeng Ye, Xiaojie Lu, Zhifeng Lei, Zhili Liu, Gaoying Geng, Qi Zhang, Hong Zhang and Hui Li
Link: https://www.mdpi.com/2079-9292/13/11/2012

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