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Journal: ElectronicsVolume: 12Number: 2033
Article: Thermal Performance of Cu Electroplated GaN/AlGaN High-Electron-Mobility Transistors with Various-Thickness Si Substrates
- Authors:
- Ray-Hua Horng1,*,
- Hsiao-Yun Yeh1 and
- Niall Tumilty2
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