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Journal: Electronics, 2023
Volume: 12
Number: 550
Article:
Study of Single Event Latch-Up Hardness for CMOS Devices with a Resistor in Front of DC-DC Converter
Authors:
by
Jindou Xin, Xiang Zhu, Yingqi Ma and Jianwei Han
Link:
https://www.mdpi.com/2079-9292/12/3/550
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