Next Article in Journal
Pattern Reconstruction from Near-Field Data Affected by 3D Probe Positioning Errors Collected via Planar-Wide Mesh Scanning
Next Article in Special Issue
Frequency-Based Sensor Interface with Dynamic Offset Compensation
Previous Article in Journal
Observation of Large Threshold Voltage Shift Induced by Pre-applied Voltage to SiO2 Gate Dielectric in Organic Field-Effect Transistors
Previous Article in Special Issue
An Analytical Approach to Calculate Soft Error Rate Induced by Atmospheric Neutrons
 
 
Article

Article Versions Notes

Electronics 2023, 12(3), 543; https://doi.org/10.3390/electronics12030543
Action Date Notes Link
article pdf uploaded. 20 January 2023 09:42 CET Version of Record https://www.mdpi.com/2079-9292/12/3/543/pdf-vor
article pdf uploaded. 20 January 2023 09:43 CET Updated version of record https://www.mdpi.com/2079-9292/12/3/543/pdf-vor
article xml file uploaded 31 January 2023 02:40 CET Original file -
article xml uploaded. 31 January 2023 02:40 CET Update https://www.mdpi.com/2079-9292/12/3/543/xml
article pdf uploaded. 31 January 2023 02:40 CET Updated version of record https://www.mdpi.com/2079-9292/12/3/543/pdf
article html file updated 31 January 2023 02:42 CET Original file -
article html file updated 8 March 2023 01:05 CET Update https://www.mdpi.com/2079-9292/12/3/543/html
Back to TopTop