Liu, K.; Zhong, S.; Wang, R.; Zhou, P.; Zhao, X.; Liu, X.
Tunnel Lining Crack Recognition Algorithm Integrating SK Attention and Cascade Neural Network. Electronics 2023, 12, 3307.
https://doi.org/10.3390/electronics12153307
AMA Style
Liu K, Zhong S, Wang R, Zhou P, Zhao X, Liu X.
Tunnel Lining Crack Recognition Algorithm Integrating SK Attention and Cascade Neural Network. Electronics. 2023; 12(15):3307.
https://doi.org/10.3390/electronics12153307
Chicago/Turabian Style
Liu, Keqiang, Shisheng Zhong, Rui Wang, Peiying Zhou, Xiaodong Zhao, and Xingen Liu.
2023. "Tunnel Lining Crack Recognition Algorithm Integrating SK Attention and Cascade Neural Network" Electronics 12, no. 15: 3307.
https://doi.org/10.3390/electronics12153307
APA Style
Liu, K., Zhong, S., Wang, R., Zhou, P., Zhao, X., & Liu, X.
(2023). Tunnel Lining Crack Recognition Algorithm Integrating SK Attention and Cascade Neural Network. Electronics, 12(15), 3307.
https://doi.org/10.3390/electronics12153307