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Journal: Electronics, 2023
Volume: 12
Number: 3149
3149
Article: Research on High-Dose-Rate Transient Ionizing Radiation Effect in Nano-Scale FDSOI Flip-Flops
Authors: by Tongde Li, Jingshuang Yuan, Yang Bai, Chunqing Yu, Chunliang Gou, Lei Shu, Liang Wang and Yuanfu Zhao
Link: https://www.mdpi.com/2079-9292/12/14/3149

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