Next Article in Journal
YOLO-Xray: A Bubble Defect Detection Algorithm for Chip X-ray Images Based on Improved YOLOv5
Previous Article in Journal
MRI Image Fusion Based on Sparse Representation with Measurement of Patch-Based Multiple Salient Features
 
 
Article

Article Versions Notes

Electronics 2023, 12(14), 3059; https://doi.org/10.3390/electronics12143059
Action Date Notes Link
article pdf uploaded. 12 July 2023 16:47 CEST Version of Record https://www.mdpi.com/2079-9292/12/14/3059/pdf-vor
article supplementary file uploaded. 12 July 2023 16:47 CEST - https://www.mdpi.com/2079-9292/12/14/3059#supplementary
article xml file uploaded 13 July 2023 06:45 CEST Original file -
article xml uploaded. 13 July 2023 06:45 CEST Update https://www.mdpi.com/2079-9292/12/14/3059/xml
article pdf uploaded. 13 July 2023 06:45 CEST Updated version of record https://www.mdpi.com/2079-9292/12/14/3059/pdf
article html file updated 13 July 2023 06:46 CEST Original file -
article html file updated 17 July 2023 08:31 CEST Update -
article html file updated 17 July 2023 08:31 CEST Update https://www.mdpi.com/2079-9292/12/14/3059/html
article supplementary file uploaded. 17 July 2023 08:31 CEST - https://www.mdpi.com/2079-9292/12/14/3059#supplementary
Back to TopTop