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Journal: Electronics, 2023
Volume: 12
Number: 32

Article: Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform
Authors: by Junhyeong Kwon, Shi-Jie Wen, Rita Fung and Sanghyeon Baeg
Link: https://www.mdpi.com/2079-9292/12/1/32

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