Berghout, T.; Benbouzid, M.; Bentrcia, T.; Lim, W.H.; Amirat, Y.
Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects. Electronics 2023, 12, 158.
https://doi.org/10.3390/electronics12010158
AMA Style
Berghout T, Benbouzid M, Bentrcia T, Lim WH, Amirat Y.
Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects. Electronics. 2023; 12(1):158.
https://doi.org/10.3390/electronics12010158
Chicago/Turabian Style
Berghout, Tarek, Mohamed Benbouzid, Toufik Bentrcia, Wei Hong Lim, and Yassine Amirat.
2023. "Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects" Electronics 12, no. 1: 158.
https://doi.org/10.3390/electronics12010158
APA Style
Berghout, T., Benbouzid, M., Bentrcia, T., Lim, W. H., & Amirat, Y.
(2023). Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects. Electronics, 12(1), 158.
https://doi.org/10.3390/electronics12010158