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Journal: Electronics, 2022
Volume: 11
Number: 525
Article:
From 32 nm to TFET Technology: New Perspectives for Ultra-Scaled RF-DC Multiplier Circuits
Authors:
by
Lionel Trojman, Eduardo Holguin, Marco Villegas, Luis-Miguel Procel and Ramiro Taco
Link:
https://www.mdpi.com/2079-9292/11/4/525
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