Agarwal, R.; Bhatti, G.; Singh, R.R.; Indragandhi, V.; Suresh, V.; Jasinska, L.; Leonowicz, Z.
Intelligent Fault Detection in Hall-Effect Rotary Encoders for Industry 4.0 Applications. Electronics 2022, 11, 3633.
https://doi.org/10.3390/electronics11213633
AMA Style
Agarwal R, Bhatti G, Singh RR, Indragandhi V, Suresh V, Jasinska L, Leonowicz Z.
Intelligent Fault Detection in Hall-Effect Rotary Encoders for Industry 4.0 Applications. Electronics. 2022; 11(21):3633.
https://doi.org/10.3390/electronics11213633
Chicago/Turabian Style
Agarwal, Ritik, Ghanishtha Bhatti, R. Raja Singh, V. Indragandhi, Vishnu Suresh, Laura Jasinska, and Zbigniew Leonowicz.
2022. "Intelligent Fault Detection in Hall-Effect Rotary Encoders for Industry 4.0 Applications" Electronics 11, no. 21: 3633.
https://doi.org/10.3390/electronics11213633
APA Style
Agarwal, R., Bhatti, G., Singh, R. R., Indragandhi, V., Suresh, V., Jasinska, L., & Leonowicz, Z.
(2022). Intelligent Fault Detection in Hall-Effect Rotary Encoders for Industry 4.0 Applications. Electronics, 11(21), 3633.
https://doi.org/10.3390/electronics11213633