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Journal: Electronics, 2022
Volume: 11
Number: 3191
Article:
Power Efficiency Characterization with Various Gate Oxide Thicknesses in Class DE Amplifiers for HIFU Applications
Authors:
by
Hyun-Sik Choi, Thinh Ngo and Yushi Zhou
Link:
https://www.mdpi.com/2079-9292/11/19/3191
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