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Journal: Electronics, 2022
Volume: 11
Number: 3191

Article: Power Efficiency Characterization with Various Gate Oxide Thicknesses in Class DE Amplifiers for HIFU Applications
Authors: by Hyun-Sik Choi, Thinh Ngo and Yushi Zhou
Link: https://www.mdpi.com/2079-9292/11/19/3191

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