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Journal: Electronics, 2022
Volume: 11
Number: 2738
Article:
Optimal Bias Condition of Dummy WL for Sub-Block GIDL Erase Operation in 3D NAND Flash Memory
Authors:
by
Beomsu Kim and Myounggon Kang
Link:
https://www.mdpi.com/2079-9292/11/17/2738
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