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Journal: Electronics, 2022
Volume: 11
Number: 1643
Article:
Total-Ionization-Dose Radiation Effects and Hardening Techniques of a Mixed-Signal Spike Neural Network in 180 nm SOI-Pavlov Process
Authors:
by
Zhen Liu, Bo Li, Jiale Quan and Jiajun Luo
Link:
https://www.mdpi.com/2079-9292/11/10/1643
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