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Journal: Electronics, 2022
Volume: 11
Number: 1561
Article:
Defect Detection for Metal Base of TO-Can Packaged Laser Diode Based on Improved YOLO Algorithm
Authors:
by
Jiayi Liu, Xingfei Zhu, Xingyu Zhou, Shanhua Qian and Jinghu Yu
Link:
https://www.mdpi.com/2079-9292/11/10/1561
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