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Journal: Electronics, 2022
Volume: 11
Number: 1561

Article: Defect Detection for Metal Base of TO-Can Packaged Laser Diode Based on Improved YOLO Algorithm
Authors: by Jiayi Liu, Xingfei Zhu, Xingyu Zhou, Shanhua Qian and Jinghu Yu
Link: https://www.mdpi.com/2079-9292/11/10/1561

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