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Journal: Electronics, 2021
Volume: 10
Number: 887

Article: Modeling and Simulation-Based Layout Optimization for Tolerance to TID Effect on n-MOSFET
Authors: by Minwoong Lee, Namho Lee, Jongyeol Kim, Younggwan Hwang and Seongik Cho
Link: https://www.mdpi.com/2079-9292/10/8/887

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