Next Article in Journal
Study and Assessment of Defect and Trap Effects on the Current Capabilities of a 4H-SiC-Based Power MOSFET
Next Article in Special Issue
Self-Biased and Supply-Voltage Scalable Inverter-Based Operational Transconductance Amplifier with Improved Composite Transistors
Previous Article in Journal
Multi-Level Switching of Al-Doped HfO2 RRAM with a Single Voltage Amplitude Set Pulse
Previous Article in Special Issue
Nonuniformity-Immune Read-In Integrated Circuit for Infrared Sensor Testing Systems
 
 
Article

Article Versions Notes

Electronics 2021, 10(6), 734; https://doi.org/10.3390/electronics10060734
Action Date Notes Link
article pdf uploaded. 19 March 2021 14:19 CET Version of Record https://www.mdpi.com/2079-9292/10/6/734/pdf-vor
article xml file uploaded 22 March 2021 11:22 CET Original file -
article xml uploaded. 22 March 2021 11:22 CET Update https://www.mdpi.com/2079-9292/10/6/734/xml
article pdf uploaded. 22 March 2021 11:22 CET Updated version of record https://www.mdpi.com/2079-9292/10/6/734/pdf
article html file updated 22 March 2021 11:24 CET Original file -
article html file updated 25 July 2022 08:25 CEST Update https://www.mdpi.com/2079-9292/10/6/734/html
Back to TopTop