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Journal: Electronics, 2021
Volume: 10
Number: 257

Article: An Effective Algorithm for MAED Problems with a New Reliability Model at the Microgrid
Authors: by Amirreza Naderipour, Akhtar Kalam, Zulkurnain Abdul-Malek, Iraj Faraji Davoudkhani, Mohd Wazir Bin Mustafa and Josep M. Guerrero
Link: https://www.mdpi.com/2079-9292/10/3/257

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