Aguirre, F.L.; Pazos, S.M.; Palumbo, F.; Morell, A.; Suñé, J.; Miranda, E.
Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults. Electronics 2021, 10, 2427.
https://doi.org/10.3390/electronics10192427
AMA Style
Aguirre FL, Pazos SM, Palumbo F, Morell A, Suñé J, Miranda E.
Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults. Electronics. 2021; 10(19):2427.
https://doi.org/10.3390/electronics10192427
Chicago/Turabian Style
Aguirre, Fernando L., Sebastián M. Pazos, Félix Palumbo, Antoni Morell, Jordi Suñé, and Enrique Miranda.
2021. "Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults" Electronics 10, no. 19: 2427.
https://doi.org/10.3390/electronics10192427
APA Style
Aguirre, F. L., Pazos, S. M., Palumbo, F., Morell, A., Suñé, J., & Miranda, E.
(2021). Assessment and Improvement of the Pattern Recognition Performance of Memdiode-Based Cross-Point Arrays with Randomly Distributed Stuck-at-Faults. Electronics, 10(19), 2427.
https://doi.org/10.3390/electronics10192427