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        Journal: Electronics, 2021
        Volume: 10 
                	Number: 1287 
                
        
        Article:
        Trap-Related Reliability Problems of Dielectrics in Memory Cells 
        Authors: 
       	by
                    Hiroshi Watanabe and Hsin-Jyun Lin        
        Link:
        https://www.mdpi.com/2079-9292/10/11/1287
        
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