Chen, Y.; Shen, Y.; Chen, Y.; Xu, G.; Liu, Y.; Huang, R.
Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors. Coatings 2024, 14, 555.
https://doi.org/10.3390/coatings14050555
AMA Style
Chen Y, Shen Y, Chen Y, Xu G, Liu Y, Huang R.
Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors. Coatings. 2024; 14(5):555.
https://doi.org/10.3390/coatings14050555
Chicago/Turabian Style
Chen, Yuyun, Yi Shen, Yuanming Chen, Guodong Xu, Yudong Liu, and Rui Huang.
2024. "Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors" Coatings 14, no. 5: 555.
https://doi.org/10.3390/coatings14050555
APA Style
Chen, Y., Shen, Y., Chen, Y., Xu, G., Liu, Y., & Huang, R.
(2024). Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors. Coatings, 14(5), 555.
https://doi.org/10.3390/coatings14050555