Oroszová, L.; Saksl, K.; Csík, D.; Nigutová, K.; Molčanová, Z.; Ballóková, B.
Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer. Coatings 2024, 14, 295.
https://doi.org/10.3390/coatings14030295
AMA Style
Oroszová L, Saksl K, Csík D, Nigutová K, Molčanová Z, Ballóková B.
Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer. Coatings. 2024; 14(3):295.
https://doi.org/10.3390/coatings14030295
Chicago/Turabian Style
Oroszová, Lenka, Karel Saksl, Dávid Csík, Katarína Nigutová, Zuzana Molčanová, and Beáta Ballóková.
2024. "Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer" Coatings 14, no. 3: 295.
https://doi.org/10.3390/coatings14030295
APA Style
Oroszová, L., Saksl, K., Csík, D., Nigutová, K., Molčanová, Z., & Ballóková, B.
(2024). Demonstration of Sensitivity of the Total-Electron-Yield Extended X-ray Absorption Fine Structure Method on Plastic Deformation of the Surface Layer. Coatings, 14(3), 295.
https://doi.org/10.3390/coatings14030295