Tan, S.Y.;                     Akbar, M.F.;                     Shrifan, N.H.M.M.;                     Nihad Jawad, G.;                     Ab Wahab, M.N.    
        Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings 2022, 12, 1440.
    https://doi.org/10.3390/coatings12101440
    AMA Style
    
                                Tan SY,                                 Akbar MF,                                 Shrifan NHMM,                                 Nihad Jawad G,                                 Ab Wahab MN.        
                Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings. 2022; 12(10):1440.
        https://doi.org/10.3390/coatings12101440
    
    Chicago/Turabian Style
    
                                Tan, Shin Yee,                                 Muhammad Firdaus Akbar,                                 Nawaf H. M. M. Shrifan,                                 Ghassan Nihad Jawad,                                 and Mohd Nadhir Ab Wahab.        
                2022. "Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing" Coatings 12, no. 10: 1440.
        https://doi.org/10.3390/coatings12101440
    
    APA Style
    
                                Tan, S. Y.,                                 Akbar, M. F.,                                 Shrifan, N. H. M. M.,                                 Nihad Jawad, G.,                                 & Ab Wahab, M. N.        
        
        (2022). Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings, 12(10), 1440.
        https://doi.org/10.3390/coatings12101440