Tan, S.Y.; Akbar, M.F.; Shrifan, N.H.M.M.; Nihad Jawad, G.; Ab Wahab, M.N.
Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings 2022, 12, 1440.
https://doi.org/10.3390/coatings12101440
AMA Style
Tan SY, Akbar MF, Shrifan NHMM, Nihad Jawad G, Ab Wahab MN.
Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings. 2022; 12(10):1440.
https://doi.org/10.3390/coatings12101440
Chicago/Turabian Style
Tan, Shin Yee, Muhammad Firdaus Akbar, Nawaf H. M. M. Shrifan, Ghassan Nihad Jawad, and Mohd Nadhir Ab Wahab.
2022. "Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing" Coatings 12, no. 10: 1440.
https://doi.org/10.3390/coatings12101440
APA Style
Tan, S. Y., Akbar, M. F., Shrifan, N. H. M. M., Nihad Jawad, G., & Ab Wahab, M. N.
(2022). Assessment of Defects under Insulation Using K-Medoids Clustering Algorithm-Based Microwave Nondestructive Testing. Coatings, 12(10), 1440.
https://doi.org/10.3390/coatings12101440