Li, G.; Hu, Y.; Wang, H.; Hao, Q.; Zhang, Y.
Shearography-Based Near-Surface Defect Detection in Composite Materials: A Spatiotemporal Object Detection Neural Network Trained Only with Simulated Data. Nanomaterials 2025, 15, 523.
https://doi.org/10.3390/nano15070523
AMA Style
Li G, Hu Y, Wang H, Hao Q, Zhang Y.
Shearography-Based Near-Surface Defect Detection in Composite Materials: A Spatiotemporal Object Detection Neural Network Trained Only with Simulated Data. Nanomaterials. 2025; 15(7):523.
https://doi.org/10.3390/nano15070523
Chicago/Turabian Style
Li, Guanlin, Yao Hu, Hao Wang, Qun Hao, and Yu Zhang.
2025. "Shearography-Based Near-Surface Defect Detection in Composite Materials: A Spatiotemporal Object Detection Neural Network Trained Only with Simulated Data" Nanomaterials 15, no. 7: 523.
https://doi.org/10.3390/nano15070523
APA Style
Li, G., Hu, Y., Wang, H., Hao, Q., & Zhang, Y.
(2025). Shearography-Based Near-Surface Defect Detection in Composite Materials: A Spatiotemporal Object Detection Neural Network Trained Only with Simulated Data. Nanomaterials, 15(7), 523.
https://doi.org/10.3390/nano15070523