Ma, L.; Xu, X.; Cui, C.; Li, T.; Lou, S.; Scott, P.J.; Jiang, X.; Zeng, W.
A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry. Nanomaterials 2025, 15, 282.
https://doi.org/10.3390/nano15040282
AMA Style
Ma L, Xu X, Cui C, Li T, Lou S, Scott PJ, Jiang X, Zeng W.
A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry. Nanomaterials. 2025; 15(4):282.
https://doi.org/10.3390/nano15040282
Chicago/Turabian Style
Ma, Liyuan, Xipeng Xu, Changcai Cui, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, and Wenhan Zeng.
2025. "A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry" Nanomaterials 15, no. 4: 282.
https://doi.org/10.3390/nano15040282
APA Style
Ma, L., Xu, X., Cui, C., Li, T., Lou, S., Scott, P. J., Jiang, X., & Zeng, W.
(2025). A Review of Measurement and Characterization of Film Layers of Perovskite Solar Cells by Spectroscopic Ellipsometry. Nanomaterials, 15(4), 282.
https://doi.org/10.3390/nano15040282
