Pruchnik, B.C.; Fidelus, J.D.; Gacka, E.; Kwoka, K.; Pruchnik, J.; Piejko, A.; Usydus, Ł.; Zaraska, L.; Sulka, G.D.; Piasecki, T.;
et al. Four-Point Measurement Setup for Correlative Microscopy of Nanowires. Nanomaterials 2023, 13, 2451.
https://doi.org/10.3390/nano13172451
AMA Style
Pruchnik BC, Fidelus JD, Gacka E, Kwoka K, Pruchnik J, Piejko A, Usydus Ł, Zaraska L, Sulka GD, Piasecki T,
et al. Four-Point Measurement Setup for Correlative Microscopy of Nanowires. Nanomaterials. 2023; 13(17):2451.
https://doi.org/10.3390/nano13172451
Chicago/Turabian Style
Pruchnik, Bartosz C., Janusz D. Fidelus, Ewelina Gacka, Krzysztof Kwoka, Julia Pruchnik, Adrianna Piejko, Łukasz Usydus, Leszek Zaraska, Grzegorz D. Sulka, Tomasz Piasecki,
and et al. 2023. "Four-Point Measurement Setup for Correlative Microscopy of Nanowires" Nanomaterials 13, no. 17: 2451.
https://doi.org/10.3390/nano13172451
APA Style
Pruchnik, B. C., Fidelus, J. D., Gacka, E., Kwoka, K., Pruchnik, J., Piejko, A., Usydus, Ł., Zaraska, L., Sulka, G. D., Piasecki, T., & Gotszalk, T. P.
(2023). Four-Point Measurement Setup for Correlative Microscopy of Nanowires. Nanomaterials, 13(17), 2451.
https://doi.org/10.3390/nano13172451
