Nishiyama, T.; Bostedt, C.; Ferguson, K.R.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.-i.; Sakai, T.; Matsunami, K.;
et al. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Appl. Sci. 2019, 9, 4932.
https://doi.org/10.3390/app9224932
AMA Style
Nishiyama T, Bostedt C, Ferguson KR, Hutchison C, Nagaya K, Fukuzawa H, Motomura K, Wada S-i, Sakai T, Matsunami K,
et al. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Applied Sciences. 2019; 9(22):4932.
https://doi.org/10.3390/app9224932
Chicago/Turabian Style
Nishiyama, Toshiyuki, Christoph Bostedt, Ken R. Ferguson, Christopher Hutchison, Kiyonobu Nagaya, Hironobu Fukuzawa, Koji Motomura, Shin-ichi Wada, Tsukasa Sakai, Kenji Matsunami,
and et al. 2019. "Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses" Applied Sciences 9, no. 22: 4932.
https://doi.org/10.3390/app9224932
APA Style
Nishiyama, T., Bostedt, C., Ferguson, K. R., Hutchison, C., Nagaya, K., Fukuzawa, H., Motomura, K., Wada, S.-i., Sakai, T., Matsunami, K., Matsuda, K., Tachibana, T., Ito, Y., Xu, W., Mondal, S., Umemoto, T., Miron, C., Nicolas, C., Kameshima, T.,
... Ueda, K.
(2019). Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Applied Sciences, 9(22), 4932.
https://doi.org/10.3390/app9224932