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X-ray Spectroscopies of High Energy Density Matter Created with X-ray Free Electron Lasers
Open AccessFeature PaperArticle

Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

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Department of Physics, Kyoto University, Kyoto 606-8502, Japan
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RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan
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Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA
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Chemical Sciences and Engineering Division, Argonne National Laboratory, 9700 S. Cass Avenue, Lemont, IL 60439, USA
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Paul-Scherrer Institute, CH-5232 Villigen PSI, Switzerland
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LUXS Laboratory for Ultrafast X-ray Sciences, Institute of Chemical Sciences and Engineering, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
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Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
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Department of Physical Science, Hiroshima University, Higashi-Hiroshima 739-8526, Japan
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Synchrotron SOLEIL, l’Orme des Merisiers, Saint-Aubin, BP 48, 91192 Gif-sur-Yvette CEDEX, France
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Extreme Light Infrastructure-Nuclear Physics (ELI-NP), “Horia Hulubei” National Institute for Physics and Nuclear Engineering, 30 Reactorului Street, Măgurele, RO-077125 Jud. Ilfov, Romania
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Laboratoire Interactions, Dynamiques et Lasers (LIDYL), Commissariat à l’Energie Atomique et aux Energies Alternatives (CEA), Centre National de la Recherche Scientifique (CNRS), Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France
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Japan Synchrotron Radiation Research Institute (JASRI), Sayo, Hyogo 679-5198, Japan
*
Author to whom correspondence should be addressed.
Appl. Sci. 2019, 9(22), 4932; https://doi.org/10.3390/app9224932
Received: 19 October 2019 / Revised: 12 November 2019 / Accepted: 14 November 2019 / Published: 16 November 2019
(This article belongs to the Special Issue Science at X-ray Free Electron Lasers)
X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses. View Full-Text
Keywords: XFEL; diffractive imaging; fluorescence spectroscopy; ion spectroscopy XFEL; diffractive imaging; fluorescence spectroscopy; ion spectroscopy
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Nishiyama, T.; Bostedt, C.; Ferguson, K.R.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.-I.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Miron, C.; Nicolas, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Appl. Sci. 2019, 9, 4932.

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