Next Article in Journal
Absorption and Remission Characterization of Pure, Dielectric (Nano-)Powders Using Diffuse Reflectance Spectroscopy: An End-To-End Instruction
Next Article in Special Issue
Pump-Probe Time-Resolved Serial Femtosecond Crystallography at SACLA: Current Status and Data Collection Strategies
Previous Article in Journal
Comparative Analysis of Rainfall Prediction Models Using Machine Learning in Islands with Complex Orography: Tenerife Island
Previous Article in Special Issue
X-ray Spectroscopies of High Energy Density Matter Created with X-ray Free Electron Lasers

Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses

Department of Physics, Kyoto University, Kyoto 606-8502, Japan
RIKEN SPring-8 Center, Sayo, Hyogo 679-5148, Japan
Linac Coherent Light Source, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA
Chemical Sciences and Engineering Division, Argonne National Laboratory, 9700 S. Cass Avenue, Lemont, IL 60439, USA
Paul-Scherrer Institute, CH-5232 Villigen PSI, Switzerland
LUXS Laboratory for Ultrafast X-ray Sciences, Institute of Chemical Sciences and Engineering, École Polytechnique Fédérale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan
Department of Physical Science, Hiroshima University, Higashi-Hiroshima 739-8526, Japan
Synchrotron SOLEIL, l’Orme des Merisiers, Saint-Aubin, BP 48, 91192 Gif-sur-Yvette CEDEX, France
Extreme Light Infrastructure-Nuclear Physics (ELI-NP), “Horia Hulubei” National Institute for Physics and Nuclear Engineering, 30 Reactorului Street, Măgurele, RO-077125 Jud. Ilfov, Romania
Laboratoire Interactions, Dynamiques et Lasers (LIDYL), Commissariat à l’Energie Atomique et aux Energies Alternatives (CEA), Centre National de la Recherche Scientifique (CNRS), Université Paris-Saclay, CEA Saclay, 91191 Gif-sur-Yvette, France
Japan Synchrotron Radiation Research Institute (JASRI), Sayo, Hyogo 679-5198, Japan
Author to whom correspondence should be addressed.
Appl. Sci. 2019, 9(22), 4932;
Received: 19 October 2019 / Revised: 12 November 2019 / Accepted: 14 November 2019 / Published: 16 November 2019
(This article belongs to the Special Issue Science at X-ray Free Electron Lasers)
X-ray free-electron lasers (XFELs) deliver ultrashort coherent laser pulses in the X-ray spectral regime, enabling novel investigations into the structure of individual nanoscale samples. In this work, we demonstrate how single-shot small-angle X-ray scattering (SAXS) measurements combined with fluorescence and ion time-of-flight (TOF) spectroscopy can be used to obtain size- and structure-selective evaluation of the light-matter interaction processes on the nanoscale. We recorded the SAXS images of single xenon clusters using XFEL pulses provided by the SPring-8 Angstrom compact free-electron laser (SACLA). The XFEL fluences and the radii of the clusters at the reaction point were evaluated and the ion TOF spectra and fluorescence spectra were sorted accordingly. We found that the XFEL fluence and cluster size extracted from the diffraction patterns showed a clear correlation with the fluorescence and ion TOF spectra. Our results demonstrate the effectiveness of the multispectroscopic approach for exploring laser–matter interaction in the X-ray regime without the influence of the size distribution of samples and the fluence distribution of the incident XFEL pulses. View Full-Text
Keywords: XFEL; diffractive imaging; fluorescence spectroscopy; ion spectroscopy XFEL; diffractive imaging; fluorescence spectroscopy; ion spectroscopy
Show Figures

Figure 1

MDPI and ACS Style

Nishiyama, T.; Bostedt, C.; Ferguson, K.R.; Hutchison, C.; Nagaya, K.; Fukuzawa, H.; Motomura, K.; Wada, S.-i.; Sakai, T.; Matsunami, K.; Matsuda, K.; Tachibana, T.; Ito, Y.; Xu, W.; Mondal, S.; Umemoto, T.; Miron, C.; Nicolas, C.; Kameshima, T.; Joti, Y.; Tono, K.; Hatsui, T.; Yabashi, M.; Ueda, K. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Appl. Sci. 2019, 9, 4932.

AMA Style

Nishiyama T, Bostedt C, Ferguson KR, Hutchison C, Nagaya K, Fukuzawa H, Motomura K, Wada S-i, Sakai T, Matsunami K, Matsuda K, Tachibana T, Ito Y, Xu W, Mondal S, Umemoto T, Miron C, Nicolas C, Kameshima T, Joti Y, Tono K, Hatsui T, Yabashi M, Ueda K. Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses. Applied Sciences. 2019; 9(22):4932.

Chicago/Turabian Style

Nishiyama, Toshiyuki, Christoph Bostedt, Ken R. Ferguson, Christopher Hutchison, Kiyonobu Nagaya, Hironobu Fukuzawa, Koji Motomura, Shin-ichi Wada, Tsukasa Sakai, Kenji Matsunami, Kazuhiro Matsuda, Tetsuya Tachibana, Yuta Ito, Weiqing Xu, Subhendu Mondal, Takayuki Umemoto, Catalin Miron, Christophe Nicolas, Takashi Kameshima, Yasumasa Joti, Kensuke Tono, Takaki Hatsui, Makina Yabashi, and Kiyoshi Ueda. 2019. "Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses" Applied Sciences 9, no. 22: 4932.

Find Other Styles
Note that from the first issue of 2016, MDPI journals use article numbers instead of page numbers. See further details here.

Article Access Map by Country/Region

Back to TopTop