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Journal: Applied SciencesVolume: 15Number: 4668
Article: Evaluation of Leakage Currents of Semiconductor Packages Due to High-Voltage Stress Under an Immersion Cooling Environment
  • Authors:
  • Kyuhae Min1,†,
  • Taejun Kang2,† and
  • Tae Yeob Kang3,*
  • et al.
Link: https://www.mdpi.com/2076-3417/15/9/4668

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