Fan, Z.; Fan, G.; Zhang, D.; Luo, T.; Han, X.; Xu, G.; Tong, H.
Mechanism of Burial Depth Effect on Recovery Under Different Coupling Models: Response and Simplification. Appl. Sci. 2025, 15, 11657.
https://doi.org/10.3390/app152111657
AMA Style
Fan Z, Fan G, Zhang D, Luo T, Han X, Xu G, Tong H.
Mechanism of Burial Depth Effect on Recovery Under Different Coupling Models: Response and Simplification. Applied Sciences. 2025; 15(21):11657.
https://doi.org/10.3390/app152111657
Chicago/Turabian Style
Fan, Zhanglei, Gangwei Fan, Dongsheng Zhang, Tao Luo, Xuesen Han, Guangzheng Xu, and Haochen Tong.
2025. "Mechanism of Burial Depth Effect on Recovery Under Different Coupling Models: Response and Simplification" Applied Sciences 15, no. 21: 11657.
https://doi.org/10.3390/app152111657
APA Style
Fan, Z., Fan, G., Zhang, D., Luo, T., Han, X., Xu, G., & Tong, H.
(2025). Mechanism of Burial Depth Effect on Recovery Under Different Coupling Models: Response and Simplification. Applied Sciences, 15(21), 11657.
https://doi.org/10.3390/app152111657
