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Journal: Applied SciencesVolume: 15Number: 11507
Article: Advancing YOLOv8-Based Wafer Notch-Angle Detection Using Oriented Bounding Boxes, Hyperparameter Tuning, Architecture Refinement, and Transfer Learning
  • Authors:
  • Eun Seok Jun,
  • Hyo Jun Sim and
  • Seung Jae Moon*
Link: https://www.mdpi.com/2076-3417/15/21/11507

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