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Journal: Appl. Sci., 2025
Volume: 15
Number: 327
Article:
DVCW-YOLO for Printed Circuit Board Surface Defect Detection
Authors:
by
Pei Shi, Yuyang Zhang, Yunqin Cao, Jiadong Sun, Deji Chen and Liang Kuang
Link:
https://www.mdpi.com/2076-3417/15/1/327
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