Huang, S.; Tang, Z.; Yang, Y.; Zhang, H.; Tian, Z.; Ma, S.; Li, J.; Zeng, C.; Ji, H.; Yao, K.;
et al. X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations. Appl. Sci. 2024, 14, 4381.
https://doi.org/10.3390/app14114381
AMA Style
Huang S, Tang Z, Yang Y, Zhang H, Tian Z, Ma S, Li J, Zeng C, Ji H, Yao K,
et al. X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations. Applied Sciences. 2024; 14(11):4381.
https://doi.org/10.3390/app14114381
Chicago/Turabian Style
Huang, Shihan, Zhiming Tang, Yang Yang, Hongming Zhang, Ziqiang Tian, Shaokun Ma, Jinyu Li, Chao Zeng, Huajian Ji, Ke Yao,
and et al. 2024. "X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations" Applied Sciences 14, no. 11: 4381.
https://doi.org/10.3390/app14114381
APA Style
Huang, S., Tang, Z., Yang, Y., Zhang, H., Tian, Z., Ma, S., Li, J., Zeng, C., Ji, H., Yao, K., & Zou, Y.
(2024). X-ray Line-Intensity Ratios in Neon-like Xenon: Significantly Reducing the Discrepancy between Measurements and Simulations. Applied Sciences, 14(11), 4381.
https://doi.org/10.3390/app14114381
