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Journal: Appl. Sci., 2023
Volume: 13
Number: 7311
Article:
Non-destructive Internal Defect Detection of In-Shell Walnuts by X-ray Technology Based on Improved Faster R-CNN
Authors:
by
Hui Zhang, Shuai Ji, Mingming Shao, Houxu Pu and Liping Zhang
Link:
https://www.mdpi.com/2076-3417/13/12/7311
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