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Journal: Appl. Sci., 2022
Volume: 12
Number: 11469
Article:
Insulated Gate Bipolar Transistor Solder Layer Defect Detection Research Based on Improved YOLOv5
Authors:
by
Qiying Ling, Xiaofang Liu, Yuling Zhang and Kai Niu
Link:
https://www.mdpi.com/2076-3417/12/22/11469
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