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Journal: Appl. Sci., 2021
Volume: 11
Number: 9058
Article:
Coincidence Detection of EELS and EDX Spectral Events in the Electron Microscope
Authors:
by
Daen Jannis, Knut Müller-Caspary, Armand Béché and Jo Verbeeck
Link:
https://www.mdpi.com/2076-3417/11/19/9058
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