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Journal: Appl. Sci., 2020
Volume: 10
Number: 8117

Article: Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma
Authors: by Chi Chen, Wenjie Fu, Chaoyang Zhang, Dun Lu, Meng Han and Yang Yan
Link: https://www.mdpi.com/2076-3417/10/22/8117

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