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Journal: Appl. Sci., 2020
Volume: 10
Number: 8117
Article:
Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma
Authors:
by
Chi Chen, Wenjie Fu, Chaoyang Zhang, Dun Lu, Meng Han and Yang Yan
Link:
https://www.mdpi.com/2076-3417/10/22/8117
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