Chen, C.; Fu, W.; Zhang, C.; Lu, D.; Han, M.; Yan, Y.
Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma. Appl. Sci. 2020, 10, 8117.
https://doi.org/10.3390/app10228117
AMA Style
Chen C, Fu W, Zhang C, Lu D, Han M, Yan Y.
Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma. Applied Sciences. 2020; 10(22):8117.
https://doi.org/10.3390/app10228117
Chicago/Turabian Style
Chen, Chi, Wenjie Fu, Chaoyang Zhang, Dun Lu, Meng Han, and Yang Yan.
2020. "Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma" Applied Sciences 10, no. 22: 8117.
https://doi.org/10.3390/app10228117
APA Style
Chen, C., Fu, W., Zhang, C., Lu, D., Han, M., & Yan, Y.
(2020). Langmuir Probe Diagnostics with Optical Emission Spectrometry (OES) for Coaxial Line Microwave Plasma. Applied Sciences, 10(22), 8117.
https://doi.org/10.3390/app10228117