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Journal: Applied SciencesVolume: 10Number: 5378
Article: Analysis of Work-Function Variation Effects in a Tunnel Field-Effect Transistor Depending on the Device Structure
  • Authors:
  • Garam Kim1,
  • Jang Hyun Kim2 and
  • Jaemin Kim1
  • et al.
Link: https://www.mdpi.com/2076-3417/10/15/5378

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