Attenuated Total Reflection for Terahertz Modulation, Sensing, Spectroscopy and Imaging Applications: A Review
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College of Biosystems Engineering and Food Science, Zhejiang University, 866 Yuhangtang Road, Hangzhou 310058, China
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Key Laboratory of On Site Processing Equipment for Agricultural Products, Ministry of Agriculture and Rural Affairs, Zhejiang University, Hangzhou 310058, China
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Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, 21 Nanyang Link, Singapore 637371, Singapore
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Centre for Disruptive Photonic Technologies, The Photonics Institute, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore
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Zhejiang A&F University, 666 Wusu Street, Lin’an, Hangzhou 311300, China
*
Author to whom correspondence should be addressed.
Appl. Sci. 2020, 10(14), 4688; https://doi.org/10.3390/app10144688
Received: 3 June 2020
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Revised: 29 June 2020
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Accepted: 1 July 2020
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Published: 8 July 2020
(This article belongs to the Special Issue Optoelectronic Instrumentation and Measurement Strategies for Optical Chemical Sensing)
Terahertz (THz) technique has become one of the most promising analytical methods and has been applied in many fields. Attenuated total reflection (ATR) technique applied in THz spectroscopy and imaging has been proven to be superior in functionalities such as modulation, sensing, analyzing, and imaging. Here, we first provide a concise introduction to the principle of ATR, discuss the factors that impact the ATR system, and demonstrate recent advances on THz wave modulation and THz surface plasmon sensing based on the THz-ATR system. Then, applications on THz-ATR spectroscopy and imaging are reviewed. Towards the later part, the advantages and limitations of THz-ATR are summarized, and prospects of modulation, surface plasmon sensing, spectroscopy and imaging are discussed.
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Keywords:
Terahertz; attenuated total reflection; modulation; sensing; spectroscopy; imaging
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MDPI and ACS Style
Huang, Y.; Singh, R.; Xie, L.; Ying, Y. Attenuated Total Reflection for Terahertz Modulation, Sensing, Spectroscopy and Imaging Applications: A Review. Appl. Sci. 2020, 10, 4688. https://doi.org/10.3390/app10144688
AMA Style
Huang Y, Singh R, Xie L, Ying Y. Attenuated Total Reflection for Terahertz Modulation, Sensing, Spectroscopy and Imaging Applications: A Review. Applied Sciences. 2020; 10(14):4688. https://doi.org/10.3390/app10144688
Chicago/Turabian StyleHuang, Yuxin, Ranjan Singh, Lijuan Xie, and Yibin Ying. 2020. "Attenuated Total Reflection for Terahertz Modulation, Sensing, Spectroscopy and Imaging Applications: A Review" Applied Sciences 10, no. 14: 4688. https://doi.org/10.3390/app10144688
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