Wu, J.; Petrov, R.H.; Kölling, S.; Koenraad, P.; Malet, L.; Godet, S.; Sietsma, J.
Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails. Metals 2018, 8, 749.
https://doi.org/10.3390/met8100749
AMA Style
Wu J, Petrov RH, Kölling S, Koenraad P, Malet L, Godet S, Sietsma J.
Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails. Metals. 2018; 8(10):749.
https://doi.org/10.3390/met8100749
Chicago/Turabian Style
Wu, Jun, Roumen H. Petrov, Sebastian Kölling, Paul Koenraad, Loic Malet, Stephane Godet, and Jilt Sietsma.
2018. "Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails" Metals 8, no. 10: 749.
https://doi.org/10.3390/met8100749
APA Style
Wu, J., Petrov, R. H., Kölling, S., Koenraad, P., Malet, L., Godet, S., & Sietsma, J.
(2018). Micro and Nanoscale Characterization of Complex Multilayer-Structured White Etching Layer in Rails. Metals, 8(10), 749.
https://doi.org/10.3390/met8100749